Structural durability test method for mobile phones

Structural durability test
Sample standard number: 11 sets.
Test period: 7 days.
Test purpose: Life test of each structure.
1.1. Keypad Test
Test environment: room temperature (20~25°C); 2 mobile phones; mobile phone set to off state.
Test Method: The navigation key and any other key perform 100,000 key presses.
Test standard: The elasticity and function of the keys of the mobile phone are normal.
1.2. Side Key Test
Test environment: room temperature (20~25°C); 1 mobile phone; mobile phone set to off state; 100,000 presses.
Test standard: The elasticity and function of the keys of the mobile phone are normal.
1.3. Flip Life Test
Test environment: room temperature (20~25°C); 4 sets of mobile phones; mobile phone is set to start state; 60,000 times of opening and closing clamshell test.
Test standard: After 60,000 mobile phones, the appearance, structure and function of the mobile phone are normal.
1.4. Slide Life Test
Test environment: room temperature (20~25°C); 4 sets of mobile phones; mobile phone is set to be turned on; 60,000 slide tests.
Test standard: After 60,000 mobile phones, the appearance, structure, and function of the mobile phone are normal, and the slider cannot be loosened.
1.5. Repeated Drop Test (Micro-dro Test)
Test environment: room temperature (20~25°C); 7cm height, 20mm PVC board; 2 mobile phones; boot status; 40,000 times.
Test standard: The functions of the mobile phone are normal, the shell is not deformed, cracked, paint is removed, the display screen is not broken, shaking is no abnormal sound.
1.6. Charger Test (Charger Test)
Test environment: room temperature (20~25°C); 2 mobile phones.
Test method: Connect the charger to the power supply, connect the mobile phone charging interface, wait for the mobile phone to display the charging interface is normal, remove the charging plug. Plug in and charge 3000 times without power on card.
Inspection standard: I/O interface is not damaged, the pad is not dropped off, and the charging function is normal. No abnormal feel.
1.7. Stylus Test
Test environment: room temperature (20~25°C); 2 mobile phones; boot status; 20,000 times.
Inspection standard: The function of the pen input is normal, the function of inserting and pulling out the structure, the shell and the pen are all normal.
1.8. Point Activation Life Test
Test conditions: touch screen tester (contact pad tip radius of 3.75mm; hardness 40deg silicone rubber)
Test method: 2 sets of mobile phones; set the mobile phone to the power on state, click on the same location 250,000 times, click on the strength of 250g; click speed: 2 times/sec;
Inspection standard: No electrical performance should occur; surface should not be damaged
1.9. Lineation Life Test
Test conditions: touch screen tester, plastic stylus with a diameter of 0.8 mm or a stylus attached to the test Test method: 2 mobile phones; set the mobile phone to the off state, and streak at least 100,000 times in the same position, the strength is 250 g, and the slide speed : 60mm/s inspection standard: no electrical performance should occur; surface should not be damaged
1.10. Battery/Battery Cover Test (Battery/Battery Cover Test)
Test environment: room temperature (20~25°C); 2 mobile phones; detach the battery/battery cap 2000 times.
Inspection standards: The mobile phone and the battery snap function are normal without deformation, and the battery contact and battery connector should be free from sagging, deformation and wear, and the appearance is not abnormal.
1.11. SIM Card Test (SIM Card Test)
Test environment: room temperature (20~25°C); 2 mobile phones; SIM card inserted and removed 1000 times repeatedly.
Inspection standards: SIM card contacts, SIM card push-and-push switch are normal, and the mobile phone reader function is normal.
1.12. Headset Test
Test environment: room temperature; 2 mobile phones; boot status; headphone plugged into the headphone jack and then pulled out, 3000 times.
Inspection standard: After the experiment, check the headphone socket for no soldering failure, no damage to the headphone plug, use of the earphone to receive and send no noise (turning the headphone plug during the call), and the headphone plugged into the headphone jack of the mobile phone will not be loose (can withstand The weight of the phone itself).
1.13. Cable Pulling Endurance Test
Test environment: room temperature (20~25°C);
Experimental method: Select a section of wire near the earplug, and fix the two ends on the experimental machine, and continue stretching for 20 seconds with a force of 20N±2N for 100 cycles.
Inspection standard: The function of the conductor is normal, and the covered sheath does not break or deform.
1.14. Cable Bending Endurance Test
Test environment: room temperature (20~25°C);
Experimental method: Select a section of wire close to the earplug and the plug, and fix the two ends of the wire on the experimental machine, and perform a 0mm~25mm bending test 3000 times.
Inspection standard: The function of the conductor is normal, and the covered sheath does not break or deform.
1.15. Cable Swing Endurance Test
Test environment: room temperature (20~25°C);
Experimental method: The headphone and the plug were respectively fixed on the experimental machine, and the head of the headphone was repeatedly swung 3000 times at an angle of 90° to 120° with a force of 1N.
Inspection standard: The function of the wire is normal, and the covering sheath does not break.